This work highlights the effectiveness of a synergistic passivation strategy for improving device performance. Finally, the successive passivation of defect states resulted in over 10% improvement in photoelectric conversion efficiency for the carbon-based PSCs prepared using the synergistic strategy. The benefits of data model partitioning include more parallel work across team members, more flexibility, and better partitioning of the logical data model. To eliminate this effect, we further processed the film with BAI (butylamine iodide) in the second step, which not only eliminated residual PbI 2, but also contributed to the formation of the 2D perovskite, optimizing energy level alignment and improving humidity stability. Data model partitioning Within a data design project, you can partition logical data model packages into sub-models to facilitate team collaboration and merging. This course teaches the process, tools, and key modeling decisions involved in designing a service-oriented architecture using IBM Rational Software. Unfortunately, this also resulted in residual PbI 2 with adverse effects. Rational Rhapsody Architect for Systems Engineers is an integrated, systems engineering environment for analyzing project requirements. First, we induced the Ostwald curing process through post-processing the MAI-PbI 2-DMSO mesophase with GUTS (guanidine thiocyanate), achieving maximum grain growth and fewer defects in the thin film. Herein, we designed an innovative synergistic passivation strategy that effectively utilized residual PbI 2 generated during Ostwald ripening as a raw material for dimensional engineering, achieving deep passivation for defects and improving the performance of the perovskite device. However, PbI 2 also serves as a critical raw material for the formation of a two-dimensional perovskite. Uncontrolled Ostwald maturation is often accompanied by residual lead iodide (PbI 2), which can degrade into elemental lead and severely damage the perovskite device upon exposure to light and radiation, ultimately accelerating device decay.
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